AFM analysis of C 60 and a poly(amido amine) dendrimer-C 60 nanoconjugate

Journal of Nanoscience and Nanotechnology

Volumn 7, Issue 4-5, 2007, Pages 1401-1405

  Chai, Minghui ^a   Jensen, Anton W ^a   Abdelhady, Hosam G ^a   Tomalia, Donald A ^a,b  

^a CENTRAL MICHIGAN UNIVERSITY   (United States)

^b Dendritic NanoTechnologies Inc   (United States)

Author keywords

Buckminsterfullerene; Dendrimer; Fractal pattern; Nanoconjugate

Indexed keywords

ATOMIC FORCE MICROSCOPY (AFM); NANOSCOPIC STRUCTURE;

MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

AMINE; DENDRIMER; FULLERENE C60; FULLERENE DERIVATIVE; NANOPARTICLE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; CONFORMATION; FRACTAL ANALYSIS; MACROMOLECULE; METHODOLOGY; NANOTECHNOLOGY; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY;

AMINES; DENDRIMERS; FRACTALS; FULLERENES; MACROMOLECULAR SUBSTANCES; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, CHEMICAL; MOLECULAR CONFORMATION; NANOPARTICLES; NANOTECHNOLOGY; SURFACE PROPERTIES;

EID: 34447525528     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2007.320     Document Type: Article

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