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Volumn 40, Issue 6, 2007, Pages 49-59

Isolation in commodity multicore processors

Author keywords

Chip multiprocessors; Fault isolation; Multicore processors

Indexed keywords


EID: 34447317810     PISSN: 00189162     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/MC.2007.213     Document Type: Article
Times cited : (14)

References (12)
  • 1
    • 35348905767 scopus 로고    scopus 로고
    • This article is based on an earlier work: N. Aggarwal et al, Configurable Isolation: Building High Availability Systems with Commodity Multicore Processors, Proc. Int'l Symp. Computer Architecture ISCA 07, ACM Press, 2007;
    • This article is based on an earlier work: N. Aggarwal et al., "Configurable Isolation: Building High Availability Systems with Commodity Multicore Processors," Proc. Int'l Symp. Computer Architecture (ISCA 07), ACM Press, 2007; http://doi.acm.org/10.1145/ 1250662.1250720.
  • 2
    • 34447336879 scopus 로고    scopus 로고
    • D. Patterson, Recovery-Oriented Computing: A New Research Agenda for a New Century, keynote address, Proc. Int'l Symp. High-Performance Computer Architecture (HPCA 02), 2002; http://roc.cs.berkeley.edu/talks/pdf/HPCAkeynote.pdf.
    • D. Patterson, "Recovery-Oriented Computing: A New Research Agenda for a New Century," keynote address, Proc. Int'l Symp. High-Performance Computer Architecture (HPCA 02), 2002; http://roc.cs.berkeley.edu/talks/pdf/HPCAkeynote.pdf.
  • 3
    • 28244437702 scopus 로고    scopus 로고
    • Heterogeneous Chip Multiprocessors
    • Nov
    • R. Kumar et al., "Heterogeneous Chip Multiprocessors," Computer, Nov. 2005, pp. 32-38.
    • (2005) Computer , pp. 32-38
    • Kumar, R.1
  • 4
    • 33846118079 scopus 로고    scopus 로고
    • Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation
    • Nov
    • S. Borkar, "Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation," IEEE Micro Nov. 2005, pp. 10-16.
    • (2005) IEEE Micro , pp. 10-16
    • Borkar, S.1
  • 7
    • 0033321638 scopus 로고    scopus 로고
    • DIVA: A Reliable Substrate for Deep Submicron Microarchitecture Design
    • MICRO, IEEE CS Press
    • T.M. Austin, "DIVA: A Reliable Substrate for Deep Submicron Microarchitecture Design," Proc. Int'l Symp. Microarchitecture (MICRO), IEEE CS Press, 1999, pp. 196-207.
    • (1999) Proc. Int'l Symp. Microarchitecture , pp. 196-207
    • Austin, T.M.1
  • 8
    • 0032597692 scopus 로고    scopus 로고
    • AR-SMT: A Microarchitectural Approach to Fault Tolerance in Microprocessors
    • IEEE CS Press
    • E. Rotenberg, "AR-SMT: A Microarchitectural Approach to Fault Tolerance in Microprocessors," Proc. Int'l Symp. Fault- Tolerant Computing, IEEE CS Press, 1999, pp. 84-91.
    • (1999) Proc. Int'l Symp. Fault- Tolerant Computing , pp. 84-91
    • Rotenberg, E.1
  • 9
    • 0038346239 scopus 로고    scopus 로고
    • Transient-Fault Recovery for Chip Multiprocessors
    • ISCA, IEEE CS Press
    • M. Gomaa et al., "Transient-Fault Recovery for Chip Multiprocessors," Proc. Int'l Symp. Computer Architecture (ISCA), IEEE CS Press, 2003, pp. 98-109.
    • (2003) Proc. Int'l Symp. Computer Architecture , pp. 98-109
    • Gomaa, M.1
  • 10
    • 4644313547 scopus 로고    scopus 로고
    • The Case for Lifetime Reliability-Aware Microprocessors
    • IEEE CS Press
    • J. Srinivasan et al., "The Case for Lifetime Reliability-Aware Microprocessors," Proc. Int'l Symp. Computer Architecture (ISCA 04), IEEE CS Press, 2004, pp. 276-287.
    • (2004) Proc. Int'l Symp. Computer Architecture (ISCA 04) , pp. 276-287
    • Srinivasan, J.1
  • 12
    • 4043157227 scopus 로고    scopus 로고
    • Reliability, Availability, and Serviceability (RAS) of the IBM eServer z990
    • Nov
    • M.L. Fair et al., "Reliability, Availability, and Serviceability (RAS) of the IBM eServer z990," IBM J. Research and Development, Nov. 2004, pp. 519-534.
    • (2004) IBM J. Research and Development , pp. 519-534
    • Fair, M.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.