Target thickness dependence of 50 keV electron bremsstrahlung

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 261, Issue 1-2 SPEC. ISS., 2007, Pages 184-188

  Williams, Scott ^a   Hayton, Keith ^a   Quarles, C A ^a  

^a TEXAS CHRISTIAN UNIVERSITY   (United States)

Author keywords

Electron beam; Polarizational bremsstrahlung; Thin film targets

Indexed keywords

POLARIZATIONAL BREMSSTRAHLUNG; TARGET THICKNESS DEPENDENCE; THIN FILM TARGETS; X RAY ABSORPTION;

ERROR CORRECTION; MEASUREMENT THEORY; MONTE CARLO METHODS; X RAY SPECTROSCOPY;

ELECTRON BEAMS;

EID: 34447261925     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.03.052     Document Type: Article

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