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Volumn 262, Issue 1, 2007, Pages 29-32
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Effects of composition and structure on gasochromic coloration of tungsten oxide films investigated with XRD and RBS
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Author keywords
Hydrogen; RBS; Sputtering; Tungsten oxide; XRD
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Indexed keywords
CRYSTALLOGRAPHY;
DEPOSITION;
HYDROGEN;
MAGNETRON SPUTTERING;
PARTIAL PRESSURE;
REACTIVE SPUTTERING;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
TUNGSTEN COMPOUNDS;
X RAY DIFFRACTION;
ATOMIC RATIO;
GASOCHROMIC COLORATION;
TUNGSTEN OXIDE;
THIN FILMS;
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EID: 34447101621
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2007.04.261 Document Type: Article |
Times cited : (25)
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References (15)
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