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Volumn 262, Issue 1, 2007, Pages 29-32

Effects of composition and structure on gasochromic coloration of tungsten oxide films investigated with XRD and RBS

Author keywords

Hydrogen; RBS; Sputtering; Tungsten oxide; XRD

Indexed keywords

CRYSTALLOGRAPHY; DEPOSITION; HYDROGEN; MAGNETRON SPUTTERING; PARTIAL PRESSURE; REACTIVE SPUTTERING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION;

EID: 34447101621     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.04.261     Document Type: Article
Times cited : (25)

References (15)
  • 14
    • 0003419936 scopus 로고
    • Tesmer J.R., and Nastasi M. (Eds), Materials Research Society, USA
    • In: Tesmer J.R., and Nastasi M. (Eds). Handbook of Modern Ion Beam Materials Analysis (1995), Materials Research Society, USA
    • (1995) Handbook of Modern Ion Beam Materials Analysis


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.