Rapid whole-pattern profile-stripping method for the quantification of multiphase samples

Powder Diffraction

Volumn 11, Issue 1, 1996, Pages 35-39

  Cressey, G ^a   Schofield, P F ^a  

^a DEPARTMENT OF LIFE SCIENCES   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 21344464176     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715600008885     Document Type: Article

References (5)

1. Deer, W. A., Howie, R. A., and Zussman, J. (1966). An Introduction to the Rock Forming Minerals (Longman, England).
2. Hill, R. J., and Howard, C. J. (1987). “Quantitative phase analysis from neutron powder diffraction data using Rietveld method,” J. Appl. Crys-tallogr. 20, 467–474.
3. Klug, H. P., and Alexander, L. E. (1974). X-ray Diffraction Procedures (Wiley, New York), 2nd ed.
4. Smith, D. K., Johnson, G. G., Jr., Scheible, A., Wims, A. M., Johnson, J. L., and Ullmann, G. (1987). “Quantitative X-ray powder diffraction method using the full diffraction pattern,” Powder Diffr. 2, 73–77.
5. Snyder, R. L., and Bish, D. L. (1989). Quantitative Analysis. Reviews in Mineralogy (Mineralogical Society of America, Washington, DC), Vol. 20, pp. 101–144.