A mechanistic study on lead-induced passivity-degradation of nickel-based alloy

Journal of the Electrochemical Society

Volumn 154, Issue 8, 2007, Pages

  Lu, B T ^a   Luo, J L ^a,c   Lu, Y C ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b ATOMIC ENERGY OF CANADA LIMITED   (Canada)

^c ELECTROCHEMICAL SOCIETY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

LEAD INDUCED PASSIVITY DEGRADATION; PASSIVE FILMS; PITTING INDUCTION TESTS;

CALCIUM; CONTAMINATION; DEGRADATION; ELECTRONIC STRUCTURE; LEAD; PASSIVATION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

NICKEL ALLOYS;

EID: 34347349123     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2741204     Document Type: Article

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