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Volumn 353, Issue 27, 2007, Pages 2646-2653
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Structure of Ni/SiO2 films prepared by sol-gel dip coating
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Author keywords
Nano clusters; Nanocrystals; Nanoparticles; Rutherford backscattering; Sol gels (xerogels); TEM SEM; X ray absorption
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
FILM THICKNESS;
NANOCLUSTERS;
NANOCRYSTALS;
NANOPARTICLES;
NICKEL;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SILICA;
SOL-GEL PROCESS;
TRANSMISSION ELECTRON MICROSCOPY;
MULTILAYER COATINGS;
SOL GEL DIP COATING;
X RAY ABSORPTION;
OXIDE FILMS;
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EID: 34347341630
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2007.05.009 Document Type: Article |
Times cited : (12)
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References (21)
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