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Volumn 353, Issue 27, 2007, Pages 2646-2653

Structure of Ni/SiO2 films prepared by sol-gel dip coating

Author keywords

Nano clusters; Nanocrystals; Nanoparticles; Rutherford backscattering; Sol gels (xerogels); TEM SEM; X ray absorption

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; FILM THICKNESS; NANOCLUSTERS; NANOCRYSTALS; NANOPARTICLES; NICKEL; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICA; SOL-GEL PROCESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 34347341630     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.05.009     Document Type: Article
Times cited : (12)

References (21)
  • 17
    • 34347341935 scopus 로고    scopus 로고
    • M. Mayer, SIMNRA Users Guide, Report IPP 9/113, Max-Plank-Institut für Plasmaphysik, Garching, Germany, 1997.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.