Microwave losses in a quasioptical dielectric resonator as a function of the thickness of ultra-thin conducting endplates

Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika)

Volumn 65, Issue 19, 2006, Pages 1783-1788

  Barannik, A A ^a   Stetsenko, A N ^b   Cherpak, N T ^a  

^a A USIKOV INSTITUTE OF RADIO PHYSICS AND ELECTRONICS   (Ukraine)

^b NATIONAL TECHNICAL UNIVERSITY   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC RESONATORS; FILM THICKNESS; THICKNESS MEASUREMENT; ULTRATHIN FILMS;

MICROWAVE LOSSES; ROOM TEMPERATURE; WAVEBANDS;

PLATES (STRUCTURAL COMPONENTS);

EID: 34347332515     PISSN: 00402508     EISSN: None     Source Type: Journal    
DOI: 10.1615/TelecomRadEng.v65.i19.40     Document Type: Article

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