Ultra-thin metallic layers studied by broadband Terahertz time-domain spectroscopy

Conference Digest of the 2004 Joint 29th International Conference on Infrared and Millimeter Waves and 12th International Conference on Terahertz Electronics

Volumn , Issue , 2004, Pages 465-466

  Kroll J ^a   Darmo, J ^a   Unterrainer, K ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CHROMIUM; ELECTRIC RESISTANCE; IONIZATION; MICROWAVES; NATURAL FREQUENCIES; PHOTOCONDUCTIVITY; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; X RAYS;

PHOTO-CONDUCTIVE SWITCHES; TERAHERTZ (THZ) RADIATION; TIME-DOMAIN SPECTROSCOPY (TDS); ULTRA-THIN METALLIC LAYERS;

OPTICAL PROPERTIES;

EID: 16244369771     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. J. Darmo et al., "Few-cycle THz generation for imaging and tomography applications", Physics-in-Medicine-and-Biology, vol. 47, p. 3691, 2002.
2. J. Darmo et al., "Terahertz emitter with integrated semiconductor Bragg mirror", Electronics-Letters, vol. 39, p. 460, 2003.
3. J. Kröll et al., "High-performance terahertz electro-optic detector", Electronic Letters, vol. 40, no. 12, 2004.