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Volumn 208, Issue 6, 2007, Pages 651-657

Thickening processes of lamellar crystal monolayers of a low-molecular-weight PEO fraction on a solid surface

Author keywords

Atomic force microscopy (AFM); Kinetics; Lamellar thickening; Poly(ethylene oxide)

Indexed keywords

ATOMIC FORCE MICROSCOPY; MONOLAYERS;

EID: 34347326492     PISSN: 10221352     EISSN: 15213935     Source Type: Journal    
DOI: 10.1002/macp.200600511     Document Type: Article
Times cited : (14)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.