In situ annealing and thickening of single crystals of C 294H590 observed by atomic force microscopy

Langmuir

Volumn 20, Issue 14, 2004, Pages 5989-5997

  Sanz, N ^a,c   Hobbs, J K ^a,b   Miles, M J ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

^c LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; DIFFUSION; IMAGE ANALYSIS; MELTING; POLYETHYLENES; SINGLE CRYSTALS; THICKNESS MEASUREMENT;

MONODISPERSITY; POLYMER CHAINS;

PARAFFINS;

ALKANES; ANNEALING; DIFFUSION; IMAGE ANALYSIS; MELTING; MICROSCOPY; POLYETHYLENE; SINGLE CRYSTALS;

EID: 3142691846     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la036385r     Document Type: Article

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