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Volumn , Issue , 2005, Pages 13-16
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A comparison between 63nm 8Gb and 90nm 4Gb multi-level cell NAND flash memory for mass storage application
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Author keywords
[No Author keywords available]
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Indexed keywords
FLASH MEMORY;
NAND CIRCUITS;
OPTIMIZATION;
SPURIOUS SIGNAL NOISE;
TRANSISTORS;
MASS STORAGE APPLICATION;
MULTI-LEVEL CELL (MLC);
SIGNAL SPEED;
TWO-MAT-CELL-ARRAY ARCHITECTURE;
SEMICONDUCTOR STORAGE;
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EID: 34250782123
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ASSCC.2005.251777 Document Type: Conference Paper |
Times cited : (10)
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References (6)
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