Feature value acquisition in testing: A sequential batch test algorithm

ACM International Conference Proceeding Series

Volumn 148, Issue , 2006, Pages 809-816

  Sheng, Victor S ^a   Ling, Charles X ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFICATION (OF INFORMATION); COMPUTER AIDED DIAGNOSIS; COST EFFECTIVENESS; ERROR ANALYSIS; FEATURE EXTRACTION; LEARNING SYSTEMS;

COST-SENSITIVE LEARNING; FEATURE VALUE ACQUISITION; PATIENT DISEASES;

ALGORITHMS;

EID: 34250776037     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1143844.1143946     Document Type: Conference Paper

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