|
Volumn , Issue , 2004, Pages 51-58
|
Test-cost sensitive naive Bayes classification
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALGORITHMS;
CLASSIFICATION (OF INFORMATION);
DATABASE SYSTEMS;
ERROR ANALYSIS;
TREES (MATHEMATICS);
X RAYS;
COST-SENSITIVE LEARNING;
FALSE POSITIVE (FP);
MARKOV DECISION PROCESS (MDP);
NAIVE BAYES CLASSIFICATION;
LEARNING SYSTEMS;
|
EID: 19544370525
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (146)
|
References (16)
|