Investigations on the growth of Zinc Oxide crystals from molten hydrous KOH solution and on the impedance analysis of Zinc Oxide crystals

Materials Letters

Volumn 61, Issue 19-20, 2007, Pages 4090-4093

  Thangavel, R ^a   Sabarinathan, V ^b   Ramasamy, S ^b   Kumar, J ^a  

^a ANNA UNIVERSITY   (India)

^b UNIVERSITY OF MADRAS   (India)

Author keywords

Dielectric properties; II VI semiconductors; SEM; XRD

Indexed keywords

CRYSTAL GROWTH; DIELECTRIC PROPERTIES; OPTIMIZATION; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SURFACE MORPHOLOGY; X RAY DIFFRACTION;

IMPEDANCE ANALYSIS; WURTZITE; X-RAY ROCKING CURVES;

ZINC OXIDE;

EID: 34250766585     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2007.01.025     Document Type: Article

References (17)

1. Zneng B.W., Guo F., and Qian Y. Adv. Funct. Mater (2004), Wiley-VCH Verlag
2. Ohasi N., et al. J. Appl. Phys. 91 (2002) 3658-3663
3. Ntep J.M., et al. J. Cryst. Growth 207 (1999) 30
4. Ohshima E., Ogino H., Niikura I., Maeda K., Sato M., Ito M., and Fukuda T. J. Cryst. Growth 260 (2004) 166
5. Hashimoto H., et al. J. Cryst. Growth 60 (1982) 207-211
6. Maeda K., Mitsuru, Niikura I., and Fukuda T. Semicond. Sci. Technol. 20 (2005) S49-S54
7. Viswanath R., and Ramasamy S. Mater. Trans. 42 (2001) 1647-1652
8. Bagnall D.M., et al. Appl. Phys. Lett. 70 (1997) 2230-2232
9. Studenikin S.A. J. Appl. Phys. 83 (1998) 2104-2111
10. Lin B., et al. Appl. Phys. Lett. 79 (2001) 943-945
11. Shalish I., Temkin H., and Narayamurti V. Phys. Rev., B 69 (2004) 245401
12. Nan C.-W., Tschope A., Holten S., Kliem H., and Birringer R. J. Appl. Phys. 85 (1999) 7735-7740
13. Ayouchi R., Leinen D., Marti{dotless}n F., Gabas M., Dalchiele E., and Ramos-Barrado J.R. Thin Solid Films 426 (2003) 68-77
14. Andres-Verges M., and West A.R. Journal of Electroceramics 1 2 (1997) 125-132
15. Moynihan C.T., Boese R., and Laberage F. Phys. Chem. Glasses 14 (1973) 22
16. Moynihan C.T. Solid State Ionics 105 (1998) 175
17. Macedo P.B., Moynihan C.T., and Boese R. Phys. Chem. Glasses 13 (1973) 171