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Volumn 2002-January, Issue , 2002, Pages 351-354

Application-specific architecture for quantum cellular automata

Author keywords

Circuits; Costs; Density functional theory; Fault tolerance; Logic arrays; Quantum cellular automata; Redundancy; Routing; Stochastic processes; Wiring

Indexed keywords

CELLULAR ARRAYS; CELLULAR AUTOMATA; COSTS; ELECTRIC WIRING; FAULT TOLERANCE; NANOTECHNOLOGY; NETWORKS (CIRCUITS); RANDOM PROCESSES; REDUNDANCY; STOCHASTIC SYSTEMS;

EID: 34250721304     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2002.1032263     Document Type: Conference Paper
Times cited : (2)

References (10)
  • 2
    • 0031123840 scopus 로고    scopus 로고
    • A device architecture for computing with quantum dots
    • C. S. Lent, P. D. Tougaw, "A device architecture for computing with quantum dots", Proceedings of the IEEE, no. 85, pp. 541, 1997
    • (1997) Proceedings of the IEEE , Issue.85 , pp. 541
    • Lent, C.S.1    Tougaw, P.D.2
  • 3
    • 0038426686 scopus 로고    scopus 로고
    • Potential for computation in micromagnetics via topological conservation laws
    • P. R. Kotiuga, T. Toffoli, "Potential for computation in micromagnetics via topological conservation laws", Physica D,no. 120, pp. 139-161, 1998
    • (1998) Physica D , Issue.120 , pp. 139-161
    • Kotiuga, P.R.1    Toffoli, T.2
  • 5
    • 0035356086 scopus 로고    scopus 로고
    • Performance assessment of adiabatic quantum cellular automata
    • June
    • L. Bonci, G. Iannaccone, and M. Macucci, "Performance assessment of adiabatic quantum cellular automata", Journal of Applied Physics, Vol 89, no. 11, June 2001.
    • (2001) Journal of Applied Physics , vol.89 , Issue.11
    • Bonci, L.1    Iannaccone, G.2    Macucci, M.3
  • 8
    • 0032026510 scopus 로고    scopus 로고
    • A Stochastic Wire-Length Distribution for Gigascale Integration (GSI) - Part (I): Derivation and Validation
    • March
    • J.A. Davis, Vivek K. De, J. D. Meindl, "A Stochastic Wire-Length Distribution for Gigascale Integration (GSI) - Part (I): Derivation and Validation", IEEE Transactions on Electron Devices, Vol45. no. 3, March 1998, pp. 580-589
    • (1998) IEEE Transactions on Electron Devices , vol.45 , Issue.3 , pp. 580-589
    • Davis, J.A.1    De, V.K.2    Meindl, J.D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.