Use of a high-temperature integrating sphere reflectometer for surface-temperature measurements

International Journal of Thermophysics

Volumn 28, Issue 2, 2007, Pages 566-580

  Hanssen, Leonard M ^a   Cagran, Claus P ^a   Prokhorov, Alexander V ^a   Mekhontsev, Sergey N ^a   Khromchenko, Vladimir B ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Emittance; Hemispherical directional reflectance factor; Non contact temperature; Pt Rh; Radiometer; SiC; Sphere reflectometer; Surface temperature

Indexed keywords

BLACKBODY TEMPERATURE; INFRARED SPECTRAL EMISSIVITY; PLANCK'S LAW; SURFACE TEMPERATURE;

CALIBRATION; INFRARED RADIATION; SILICON CARBIDE; SPECTRUM ANALYSIS; SURFACE CHEMISTRY; TEMPERATURE MEASUREMENT; THERMAL EFFECTS;

REFLECTOMETERS;

EID: 34250687079     PISSN: 0195928X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10765-007-0180-4     Document Type: Conference Paper

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