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Volumn 90, Issue 24, 2007, Pages

Field emission observed from metal-diamond junctions revealed by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIAMONDS; NANOPARTICLES; SUBSTRATES;

EID: 34250646702     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2746079     Document Type: Article
Times cited : (3)

References (17)
  • 11
    • 34250616148 scopus 로고    scopus 로고
    • Veeco Application note AN27 for Dimension 3100.
    • Veeco Application note AN27 for Dimension 3100.
  • 12
    • 34250659133 scopus 로고    scopus 로고
    • Patent Aapplication No. PCT/GB2004/003696 (29 August 2004).
    • Patent Aapplication No. PCT/GB2004/003696 (29 August 2004).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.