Point-contact Andreev spectroscopy on thin Ni2 MnIn Heusler films

Journal of Magnetism and Magnetic Materials

Volumn 316, Issue 2 SPEC. ISS., 2007, Pages

  Scholtyssek, J M ^a   Bocklage, L ^a   Anton, R ^a   Merkt, U ^a   Meier, G ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

Andreev reflection; Epitaxial growth; Heusler alloy; Spin polarization

Indexed keywords

AMORPHOUS CARBON; CARBON FILMS; EPITAXIAL GROWTH; POINT CONTACTS; STOICHIOMETRY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

COEVAPORATION; HEUSLER ALLOY; HEUSLER FILMS; POINT-CONTACT ANDREEV SPECTROSCOPY;

NICKEL COMPOUNDS;

EID: 34250355908     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2007.03.153     Document Type: Article

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