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Volumn , Issue , 2006, Pages 1630-1633

A new cavity perturbation technique for accurate measurement of dielectric parameters

Author keywords

Cavity perturbation; Complex permittivity; Depolarization

Indexed keywords

CAVITY PERTURBATION; COMPLEX PERMITTIVITY; DIELECTRIC PARAMETERS; RECTANGULAR CAVITY;

EID: 34250323910     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2006.249650     Document Type: Conference Paper
Times cited : (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.