Nondestructive determination of electromagnetic parameters of dielectric materials at X-Band frequencies using a waveguide probe system

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 5, 1997, Pages 1084-1092

  Chang, Chih Wei ^a   Chen, Kun Mu ^b   Qian, Jian ^c  

^a MINGHSIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b Michigan State University   (United States)

^c Naming University   (China)

Author keywords

Calibration of probe system; Electromagnetic parameters of materials; Integral equation method; Nondestructive determination; Permittivity and permeability; Waveguide probe system; X band frequency

Indexed keywords

CALIBRATION; ELECTRIC FIELD EFFECTS; ELECTROMAGNETIC WAVE REFLECTION; INTEGRAL EQUATIONS; MAGNETIC PERMEABILITY MEASUREMENT; MEASUREMENT ERRORS; NONDESTRUCTIVE EXAMINATION; PERMITTIVITY MEASUREMENT; RECTANGULAR WAVEGUIDES; REFLECTOMETERS;

GALERKIN'S METHOD;

DIELECTRIC MATERIALS;

EID: 0031247096     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.676717     Document Type: Article

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