Multilayer systems of alternating chalcogenide As-Se and polymer thin films prepared using thermal evaporation and spin-coating techniques

Journal of Physics and Chemistry of Solids

Volumn 68, Issue 5-6, 2007, Pages 1268-1271

  Kohoutek, T ^a   Wagner, T ^a   Orava, J ^a   Krbal, M ^a   Ilavsky, J ^b   Vesely, D ^a   Frumar, M ^a  

^a UNIVERSITY OF PARDUBICE   (Czech Republic)

^b Solvay Slovchem Ltd   (Slovakia)

Author keywords

A. Chalcogenides; A. Polymers; A. Thin films; D. Optical properties

Indexed keywords

ATOMIC FORCE MICROSCOPY; BANDWIDTH; CHARACTERIZATION; FILM THICKNESS; POLYMER FILMS; PROFILOMETRY; SPIN COATING; THERMAL EVAPORATION; THIN FILMS;

MULTILAYER PLANAR SYSTEMS; POLYAMIDE-IMIDE (PAI); POLYVINYL-BUTYRAL (PVB); REFLECTION BANDS;

CHALCOGENIDES;

EID: 34250212913     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2007.01.011     Document Type: Article

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