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Volumn 14, Issue 3, 2007, Pages 627-633

Surface charges on alumina in vacuum with varying surface roughness and electric field distribution

Author keywords

Alumina insulator; Charging characteristics; Electric field distribution; Secondary electron emission avalanche (SEEA); Surface roughness; Vacuum

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRIC INSULATORS; SECONDARY EMISSION; SURFACE CHARGE; SURFACE ROUGHNESS; VACUUM;

EID: 34250212564     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2007.369523     Document Type: Conference Paper
Times cited : (85)

References (10)
  • 1
    • 0024752562 scopus 로고
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    • Miller, H.C.1
  • 2
    • 0027640830 scopus 로고
    • Flashover of Insulators in Vacuum
    • H. C. Miller, "Flashover of Insulators in Vacuum", IEEE Trans. Electr. Insul., Vol.28, pp.512-527, 1993.
    • (1993) IEEE Trans. Electr. Insul , vol.28 , pp. 512-527
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  • 4
    • 0027640717 scopus 로고
    • The Effect of Insulator Charging on Breakdown and Conditioning
    • J. M. Wetzer and P. A. A. F. Woutcrs, "The Effect of Insulator Charging on Breakdown and Conditioning", IEEE Trans. Dielectr. Electr. Insul., Vol.28, pp.681-691, 1993.
    • (1993) IEEE Trans. Dielectr. Electr. Insul , vol.28 , pp. 681-691
    • Wetzer, J.M.1    Woutcrs, P.A.A.F.2
  • 6
    • 0033362395 scopus 로고    scopus 로고
    • Charging Characteristics on Dielectric Surface by Different Charging Processes in Vacuum
    • Y. Yamano, A. Ohashi, K. Kalo and H. Okubo, "Charging Characteristics on Dielectric Surface by Different Charging Processes in Vacuum", IEEE Trans. Dielectr. Electr. Insul., Vol.6, pp.464-468, 1999.
    • (1999) IEEE Trans. Dielectr. Electr. Insul , vol.6 , pp. 464-468
    • Yamano, Y.1    Ohashi, A.2    Kalo, K.3    Okubo, H.4
  • 8
    • 16244409418 scopus 로고    scopus 로고
    • Charging Characteristics and Electric Field Distribution on Alumina as Affected by Triple Junction in Vacuum
    • Y. Yamano, S. Ito, K. Kato, H. Okubo and Y. Hakamata, "Charging Characteristics and Electric Field Distribution on Alumina as Affected by Triple Junction in Vacuum", IEEE Trans. Dielectr. Electr. Insul., Vol. 10, pp.563-568, 2003.
    • (2003) IEEE Trans. Dielectr. Electr. Insul , vol.10 , pp. 563-568
    • Yamano, Y.1    Ito, S.2    Kato, K.3    Okubo, H.4    Hakamata, Y.5
  • 9
    • 0141988565 scopus 로고    scopus 로고
    • Real-time and High-speed Measurements of Charging Processes on Dielectric Surface in Vacuum
    • K. Suzuki, K. Kato, Y. Hakamata, H. Okubo, "Real-time and High-speed Measurements of Charging Processes on Dielectric Surface in Vacuum", IEEE Trans. Dielectr. Electr. Insul., Vol. 10, pp.563-568, 2003.
    • (2003) IEEE Trans. Dielectr. Electr. Insul , vol.10 , pp. 563-568
    • Suzuki, K.1    Kato, K.2    Hakamata, Y.3    Okubo, H.4
  • 10
    • 16244421058 scopus 로고    scopus 로고
    • K. Usui, Y. Taniguchi and H. Okubo, Influence of Alumina Characteristics on Charging Mechanism in Vacuum, 21st IEEE International Symposium on Discharges and Electrical Insulation in Vacuum(ISDEIV), 1, 1C-08, pp. 114-117, 2004.
    • K. Usui, Y. Taniguchi and H. Okubo, "Influence of Alumina Characteristics on Charging Mechanism in Vacuum", 21st IEEE International Symposium on Discharges and Electrical Insulation in Vacuum(ISDEIV), Vol.1, 1C-08, pp. 114-117, 2004.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.