Real-time and high-speed measurements of charging processes on dielectric surface in vacuum

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 10, Issue 4, 2003, Pages 563-568

  Suzuki, Kiyoteru ^a   Kato, Katsumi ^a   Hakamata, Yoshimi ^b   Okubo, Hitoshi ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b HITACHI LTD   (Japan)

Author keywords

Charging; Dielectrics; Electron emission; Triple junction; Vacuum

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC FIELD EFFECTS; ELECTRON EMISSION; ELECTROSTATICS; LIGHT EMISSION; MATHEMATICAL MODELS; RELAXATION PROCESSES; VACUUM APPLICATIONS;

CHARGING PROCESSES; DIELECTRIC SURFACE; TRIPLE JUNCTION;

DIELECTRIC MATERIALS;

EID: 0141988565     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2003.1219638     Document Type: Article

References (9)

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