Simulation and ground test for the total ionizing dose effects of STSAT-2

Journal of the Korean Physical Society

Volumn 50, Issue 5 PART I, 2007, Pages 1552-1556

  Ryu, Kwangsun ^a   Shin, Goo Hwan ^a   Kim, Hyung Myung ^a   Kim, Sungjoon ^a   Ko, Dai Ho ^a   Kim, Heejun ^a   Min, Kyungwook ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

MOSFET; Satellite; Space radiation; Total ionizing dose

Indexed keywords

EID: 34250177294     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.50.1552     Document Type: Article

References (15)

1. H. S. Kim, Y. Kim, S. J. Noh and M. H. Kim, J. Korean Phys. Soc. 45, S820 (2004).
2. Y. H. Shin, K. W. Min, J. G, Rhee, D. H. Lee, S. H. Kim, H. S. Kim, S. D. Park, D. K. Sung and S. D. Choi, IEEE Trans. Nucl. Sci. 46, 1586 (1999).
3. S. J. Kim, K. W. Min, D. Ko and J. Seon, J. Korean Phys. Soc. 48, 865 (2006).
4. Y. K. Lim, B. S. Park, S. K. Lee, K. R. Kim and T. K. Yang, J. Korean Phys. Soc. 48, 777 (2006).
5. Y. Y. Lee, Nucl. Eng. Technol. 37, 433 (2005).
6. J. I. Vette, The NASA/National Space Science Data Center Trapped Radiation Environment Program (1964-1991), NSSDC 91-29, NASA/Goddard Space Plight Center, National Space Science Data Center, Greenbelt, MD (1991).
7. J. L. Barth, in 1997 IEEE NSREC Short Course, (IEEE Publishing Services, Piscataway, New Jersey, 1997).
8. J. Feynman, G. Spitale, J. Wang and S. Gabriel, J. Geophys. Res. 98, 13281 (1993).
9. A. J. Tylka, J. H. Adams Jr., P. R. Boberg, B. Brownstein, W. F. Dietrich, E. O. Flueckiger, E. L. Petersen, M. A. Shea, D. F. Smart and E. C. Smith, IEEE Trans. Nucl. Sci. 44, 2150 (1997).
10. S. M. Seltzer, Updated Calculations for Routine Space-Shielding Eadiation dose Estimates: SHIELDOSE-2 (NIST Publication NISTIR 5477, Gaithersburg, MD, 1994).
11. ISO/ASTM 51607, Practice for use of the Alanine-EPR Dosimetry System (International Organization for Standardization, 2004).
12. J. Schwank, in 2002 IEEE NSREC Short Course (IEEE Publishing Services, Piscataway, New Jersey, 2002).
13. P. J. McWhorter and P. S. Winokur, Appl. Phys. Lett. 48, 133 (1986).
14. J. R. Brews, Applied Solid State Science, edited by Dawon Kahny (Academic Press, New York, 1981).
15. Y. Taur and T. H. Ning, Fundamentals of Modern VLSI Devices (Cambrige University Press, New York, 1998).