Characterization of the evanescent field in objective-based Total-Internal-Reflection Fluorescence (TIRF) microscopy

Journal of the Korean Physical Society

Volumn 50, Issue 5, 2007, Pages 1340-1345

  Lee, Ja Yil ^a   Kim, Shul Kee ^a   Hong, Seok Cheol ^a  

^a Korea University   (South Korea)

Author keywords

Evanescent field; Total internal reflection fluorescence microscopy; Z distance measurement

Indexed keywords

EID: 34250159520     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.50.1340     Document Type: Article

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