Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 260, Issue 1, 2007, Pages 85-90

  Oikawa, Masakazu ^a,b   Satoh, Takahiro ^a   Sakai, Takuro ^a   Miyawaki, Nobumasa ^a   Kashiwagi, Hirotsugu ^a   Kurashima, Satoshi ^a   Okumura, Susumu ^a   Fukuda, Mitsuhiro ^c   Yokota, Watalu ^a   Kamiya, Tomihiro ^a,b  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b GUNMA UNIVERSITY   (Japan)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

Biotechnology; Focusing lens; Microbeam; Single event phenomena; Single ion hit

Indexed keywords

BIOTECHNOLOGY; COPPER; CYCLOTRONS; ION BEAMS; OPTICAL RESOLVING POWER; X RAYS;

ELECTRON IMAGE; FOCUSING LENS; MICROBEAMS; SINGLE EVENT PHENOMENA; SINGLE ION HIT;

HEAVY IONS;

EID: 34249877398     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.01.280     Document Type: Article

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