Characterization of the field-dependent permittivity of nonlinear ferroelectric films using tunable coplanar lines

IEEE Microwave and Wireless Components Letters

Volumn 17, Issue 6, 2007, Pages 442-444

  Giere, Andre ^a,b   Scheele, Patrick ^a,b   Zheng, Yuliang ^a,b   Jakoby, Rolf ^a,b  

^a IEEE   (Germany)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Characterization; Coplanar line; Ferroelectric; Finite difference time domain (FDTD); Permittivity; Planar; Tunable

Indexed keywords

COPLANAR LINES; NONLINEAR FERROELECTRIC FILMS; NONLINEAR TUNABILITY; TUNABILITY OPTIMIZATION;

CHARACTERIZATION; COPLANAR WAVEGUIDES; ELECTRIC LINES; FINITE DIFFERENCE TIME DOMAIN METHOD; PERMITTIVITY; THICK FILM CIRCUITS;

FERROELECTRIC FILMS;

EID: 34249876601     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2007.897795     Document Type: Article

References (4)

1. M. Ouaddari, S. Delprat, F. Vidal, M. Chaker, and K. Wu, "Microwave characterization of ferroelectric thin-film materials," IEEE Trans. Microw. Theory Tech., vol. 53, no. 4, pp. 1390-1397, Apr. 2005.
2. A. Giere, P. Scheele, C. Damm, and R. Jakoby, "Optimization of uniplanar multilayer structures using nonlinear tunable dielectrics," in Proc. 35th Eur. Microw. Conf., Oct. 2005, pp. 561-564.
3. W. Heinrich, "Quasi-tem description of mmic coplanar lines including conductor-loss effects," IEEE Trans. Microw. Theory Tech., vol. 41, no. 1, pp. 45-52, Jan 1993.
4. E. Marsan, J. Gauthier, M. Chaker, and K. Wu, "Tunable microwave device: Status and perspective," in Proc. 3rd Int. IEEE NEWCAS Conf., Jun. 19-22, 2005, pp. 279-282.