Semiconducting properties of passive films formed on Fe-Cr alloys using capacitiance measurements and cyclic voltammetry techniques

Materials Chemistry and Physics

Volumn 104, Issue 1, 2007, Pages 98-104

  Lee, Jae Bong ^a   Kim, Suk Won ^a  

^a Kookmin University   (South Korea)

Author keywords

AES; Capacitance measurement; Cyclic voltammetry; Mott Schottky plots; Passive film; Space charge layer

Indexed keywords

CAPACITANCE MEASUREMENT; CHROMIUM ALLOYS; CURRENT DENSITY; CYCLIC VOLTAMMETRY; IRON ALLOYS; SEMICONDUCTOR MATERIALS;

MOTT-SCHOTTKY PLOTS; PASSIVE FILM; SPACE CHARGE LAYER;

THIN FILMS;

EID: 34249785655     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2007.02.089     Document Type: Article

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