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Volumn 30, Issue 2, 2007, Pages 342-349

Surface current modelling of the skin effect for on-chip interconnections

Author keywords

On chip interconnect; Resistance and inductance matrices; Skin effect; Surface impedance admittane

Indexed keywords

ELECTRIC ADMITTANCE; ELECTRIC CURRENTS; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; INDUCTANCE; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; SKIN EFFECT;

EID: 34249776341     PISSN: 15213323     EISSN: None     Source Type: Journal    
DOI: 10.1109/TADVP.2007.895984     Document Type: Conference Paper
Times cited : (24)

References (10)
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  • 2
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  • 4
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    • Skin effect modeling based on a differential surface admittance operator
    • Aug
    • D. De Zutter and L. Knockaert, "Skin effect modeling based on a differential surface admittance operator," IEEE Trans. Microwave Theory Tech., vol. 53, no. 8, pp. 1199-1206, Aug. 2005.
    • (2005) IEEE Trans. Microwave Theory Tech , vol.53 , Issue.8 , pp. 1199-1206
    • De Zutter, D.1    Knockaert, L.2
  • 5
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    • Horton, R.1    Easter, B.2    Gopinath, A.3
  • 7
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    • Quasistatic conductor loss calculation in transmission lines using a new conformal mapping technique
    • Sep
    • E. Tuncer, B.-T. Lee, M. S. Islam, and D. P. Neikirk, "Quasistatic conductor loss calculation in transmission lines using a new conformal mapping technique," IEEE Trans. Microwave Theory Tech., vol. 42, no. 9, pp. 1807-1815, Sep. 1994.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.