Analytical results on style-constrained Bayesian classification of pattern fields

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 29, Issue 7, 2007, Pages 1280-1285

  Veeramachaneni, Sriharsha ^a   Nagy, George ^b  

^a ITC IRST   (Italy)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

Adaptive classification; Bayesian classification; Field classification; Style context

Indexed keywords

BAYESIAN NETWORKS; FEATURE EXTRACTION; OPTIMIZATION; PATTERN MATCHING;

ADAPTIVE CLASSIFICATION; BAYESIAN CLASSIFICATION; FIELD CLASSIFICATION; STYLE CONTEXT;

IMAGE CLASSIFICATION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BAYES THEOREM; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THREE DIMENSIONAL IMAGING;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BAYES THEOREM; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 34249728993     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2007.1030     Document Type: Article

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