Standard deviations of composition measurements in atom probe analyses. Part I. Conventional 1D atom probe

Ultramicroscopy

Volumn 107, Issue 9, 2007, Pages 734-738

  Danoix, F ^a   Grancher, G ^a   Bostel, A ^a   Blavette, D ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

Atom probe tomography; Detection efficiency; Statistical analysis

Indexed keywords

CONCENTRATION (PROCESS); CRYSTAL ATOMIC STRUCTURE; IONS; MATERIALS SCIENCE; MEASUREMENT THEORY; THREE DIMENSIONAL COMPUTER GRAPHICS;

ATOM PROBE TOMOGRAPHY; DETECTION EFFICIENCY;

PROBES;

ARTICLE; MATHEMATICAL COMPUTING; MECHANICAL PROBE; MICROANALYSIS; SIGNAL DETECTION; STATISTICAL ANALYSIS; THREE DIMENSIONAL IMAGING;

EID: 34249708358     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.02.006     Document Type: Article

References (6)

1. Miller M.K., and Smith G.D.W. Atom Probe Microanalysis, Principles and Applications to Materials Problems (1989), Materials Research Society, Pittsburgh
2. Miller K., Cerezo A., Hetherington M.G., and Smith G.D.W. Atom Probe Field ion Microscopy (1996), Clarendon Press, Oxford
3. Miller M.K. Atom Probe Tomography, Analysis at the Atomic Scale (2000), Kluwer Academic Publishers, New York
4. Fuller W.A. Introduction to Statistical Time Series (1976), Wiley, New York
5. Feller W. An Introduction to Probability Theory and its Application (1957), Wiley, London
6. F. Danoix, G. Grancher, A. Bostel, D. Blavette, this issue, doi:10.1016/j.ultramic.2007.02.005.