Standard deviations of composition measurements in atom probe analyses-Part II: 3D atom probe

Ultramicroscopy

Volumn 107, Issue 9, 2007, Pages 739-743

  Danoix, F ^a   Grancher, G ^a   Bostel, A ^a   Blavette, D ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

Atom probe tomography; Detection efficiency; Statistical analysis

Indexed keywords

ATOMIC PHYSICS; CRYSTAL ATOMIC STRUCTURE; MEASUREMENT THEORY; PROBES;

ATOM PROBE TOMOGRAPHY; ATOM PROBES; DETECTION EFFICIENCY;

ION MICROSCOPES;

ARTICLE; MATHEMATICAL COMPUTING; MECHANICAL PROBE; STATISTICAL ANALYSIS; THREE DIMENSIONAL IMAGING; TOMOGRAPHY;

EID: 34249750491     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.02.005     Document Type: Article

References (8)

1. F. Danoix, G. Grancher, A. Bostel, D. Blavette, Surf. Interface Anal. this issue (previous paper).
2. Miller M.K., and Smith G.D.W. Atom Probe Microanalysis, Principles and Applications to Materials Problems (1989), Materials Research Society, Pittsburgh
3. Miller M.K., Cerezo A., Hetherington M.G., and Smith G.D.W. Atom Probe Field ion Microscopy (1996), Clarendon Press, Oxford
4. Cerezo A., Godfrey T., and Smith G.D.W. Rev. Sci. Instrum. 59 (1988) 862
5. M.K. Miller, Atom probe tomography, analysis at the atomic scale.
6. De Geuser F., Lefebvre W., Danoix F., Vurpillot F., Forbord B., and Blavette D. Surf. Interface Anal 39 (2007) 268
7. See 〈http://www.imago.com/imago/html/products/LEAP3000.jsp〉.
8. See 〈http://www.cameca.fr/html/product_tap.html〉.