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Volumn 44, Issue 3, 2007, Pages 201-209

Using the autocorrelation function to characterize time series of voltage measurements

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; FUNCTION EVALUATION; LOW PASS FILTERS; TIME SERIES ANALYSIS; VOLTAGE MEASUREMENT; WHITE NOISE;

EID: 34249675767     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/44/3/006     Document Type: Article
Times cited : (22)

References (16)
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    • Barnes, J.A.1    Al, E.2
  • 3
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    • Using power spectra and Allan variances to characterize the noise of Zener-diode voltage standards
    • Witt T J and Reymann D 2000 Using power spectra and Allan variances to characterize the noise of Zener-diode voltage standards IEE Proc. Sci. Meas. Technol. 147 177-82
    • (2000) IEE Proc. Sci. Meas. Technol. , vol.147 , Issue.4 , pp. 177-182
    • Witt, T.J.1    Reymann, D.2
  • 5
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    • Calculation of the uncertainty of the mean of autocorrelated measurements
    • Zhang N F 2006 Calculation of the uncertainty of the mean of autocorrelated measurements Metrologia 43 S276-81
    • (2006) Metrologia , vol.43 , Issue.4
    • Zhang, N.F.1
  • 7
    • 17444420046 scopus 로고    scopus 로고
    • Allan variances and spectral densities for dc voltage measurements with polarity reversals
    • Witt T J 2005 Allan variances and spectral densities for dc voltage measurements with polarity reversals IEEE Trans. Instrum. Meas. 54 550-3
    • (2005) IEEE Trans. Instrum. Meas. , vol.54 , Issue.2 , pp. 550-553
    • Witt, T.J.1
  • 8
    • 0032120798 scopus 로고    scopus 로고
    • Measurements of the temperature dependence of the output voltages of some Zener diode based voltage standards
    • Witt T J 1998 Measurements of the temperature dependence of the output voltages of some Zener diode based voltage standards IEE Proc. Sci. Meas. Technol. 145 154-8
    • (1998) IEE Proc. Sci. Meas. Technol. , vol.145 , Issue.4 , pp. 154-158
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  • 13
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    • Investigations of noise in measurements of electronic voltage standards
    • Witt T J and Tang Y 2005 Investigations of noise in measurements of electronic voltage standards IEEE Trans. Instrum. Meas. 54 567-70
    • (2005) IEEE Trans. Instrum. Meas. , vol.54 , Issue.2 , pp. 567-570
    • Witt, T.J.1    Tang, Y.2
  • 14
    • 0035308763 scopus 로고    scopus 로고
    • Using the Allan variance and power spectral density to characterize dc nanovoltmeters
    • Witt T J 2001 Using the Allan variance and power spectral density to characterize dc nanovoltmeters IEEE Trans. Instrum. Meas. 50 445-8
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , Issue.2 , pp. 445-448
    • Witt, T.J.1
  • 15
    • 18444416991 scopus 로고    scopus 로고
    • CODATA recommended values of the fundamental physical constants
    • Mohr P J and Taylor B N 2005 CODATA recommended values of the fundamental physical constants Rev. Mod. Phys. 77 1-107
    • (2005) Rev. Mod. Phys. , vol.77 , Issue.1 , pp. 1-107
    • Mohr, P.J.1    Taylor, B.N.2
  • 16
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    • Accurate measurement of the Planck constant
    • Williams E R et al 1998 Accurate measurement of the Planck constant Phys. Rev. Lett. 81 2404-7
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.