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Volumn 441, Issue 1-3, 2007, Pages 63-67
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Oxygen effect on the interfacial electronic structure of C60 film studied by ultraviolet photoelectron spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
DOPING (ADDITIVES);
IMPURITIES;
OXYGEN;
ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;
BAND BENDING;
CARRIER-TRAPS;
RESIDUAL IMPURITIES;
ELECTRONIC STRUCTURE;
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EID: 34249658265
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cplett.2007.04.080 Document Type: Article |
Times cited : (44)
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References (23)
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