Electron back scattering diffraction (EBSD) analysis of hypereutectic Al-Si alloys modified by Sr and Sc

Metals and Materials International

Volumn 13, Issue 2, 2007, Pages 103-107

  Kim, Myunghan ^a  

^a Chungbuk National University   (South Korea)

Author keywords

EBSD; Growth mode; Misorientation angle; Twin boundary

Indexed keywords

ALUMINUM ALLOYS; BACKSCATTERING; SCANDIUM; SCANDIUM ALLOYS; STRONTIUM;

EBSD; EBSD ANALYSIS; ELECTRON BACKSCATTERING DIFFRACTION; GROWTH MODES; HYPEREUTECTIC AL-SI ALLOYS; MISORIENTATION ANGLE; SPECIAL BOUNDARIES; TWIN BOUNDARIES;

SILICON ALLOYS;

EID: 34249304456     PISSN: 15989623     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03027559     Document Type: Article

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