Impurities detection by optical techniques in KH2PO4 crystals

Optics Communications

Volumn 275, Issue 2, 2007, Pages 372-378

  Pommies M ^a   Damiani, D ^a   Le Borgne, X ^a   Dujardin, C ^b   Surmin, A ^a   Birolleau, J C ^a   Pilon, F ^a   Bertussi, B ^a   Piombini, H ^a  

^a CEA LE RIPAULT   (France)

^b UNIVERSITÉ LYON 1   (France)

Author keywords

Contamination; Fluorescence; KDP heterogeneities; Material characterization

Indexed keywords

ATOMIC EMISSION SPECTROSCOPY; CONTAMINATION; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; FLUORESCENCE; LASER DAMAGE; LASERS; PHOTOEXCITATION; SINGLE CRYSTALS;

KDP HETEROGENEITIES; LASER-INDUCED DAMAGE PRECURSORS; LASER-INDUCED DAMAGE THRESHOLD (LIDT); MATERIAL CHARACTERIZATION;

OPTICAL INSTRUMENTS;

EID: 34249287317     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2007.03.057     Document Type: Article

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