Detection and characterization of lower LIDT regions in KDP material

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5991, Issue , 2005, Pages

  Pommiès, Matthieu ^a   Damiani, David ^a   Piombini, Hervé ^a   Bertussi, Bertrand ^b   Capoulade, Jérémie ^b   Natoli, Jean Yves ^b   Mathis, Hervé ^a  

^a CEA LE RIPAULT   (France)

^b AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Excimer laser conditioning; KDP heterogeneities; Laser induced damage

Indexed keywords

CRYSTALS; EXCIMER LASERS; HIGH POWER LASERS; OPTICAL FREQUENCY CONVERSION;

EXCIMER LASER CONDITIONING; KDP CRYSTALS; KDP HETEROGENEITIES;

LASER DAMAGE;

EID: 33644600168     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.637892     Document Type: Conference Paper

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