Derivation of length of carbon nanotube responsible for electron emission from field emission characteristics

Applied Physics Letters

Volumn 90, Issue 20, 2007, Pages

  Gotoh, Y ^a   Kawamura, Y ^a   Niiya, T ^a   Ishibashi, T ^a   Nicolaescu, D ^a   Tsuji, H ^a   Ishikawa, J ^a   Hosono, A ^b   Nakata, S ^b   Okuda, S ^b  

^a KYOTO UNIVERSITY   (Japan)

^b MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; GLASS; SUBSTRATES;

FIELD EMISSION ARRAYS; FOWLER-NORDHEIM PLOT;

CARBON NANOTUBES;

EID: 34249089307     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2740199     Document Type: Article

References (17)

1. W. J. Zhao, N. Kawakami, A. Sawada, and M. Takai, J. Vac. Sci. Technol. B 21, 1734 (2003).
2. Y. C. Kim, K. H. Sohn, Y. M. Cho, and E. H. Yoo, Appl. Phys. Lett. 84, 5350 (2004).
3. Y. Gotoh, T. Kondo, M. Nagao, H. Tsuji, J. Ishikawa, K. Hayashi, and T. Kobashi, J. Vac. Sci. Technol. B 18, 1018 (2000).
4. J. Ishikawa, H. Tsuji, Y. Gotoh, T. Sasaki, T. Kaenko, M. Nagao, and K. Inoue, J. Vac. Sci. Technol. B 11, 308 (1993).
5. Y. Gotoh, M. Nagao, M. Matsubara, K. Inoue, H. Tsuji, and J. Ishikawa, Jpn. J. Appl. Phys., Part 2 35, L1297 (1996).
6. Y. Gotoh, D. Nozaki, H. Tsuji, J. Ishikawa, T. Nakatani, T. Sakashita, and K. Betsui, Appl. Phys. Lett. 77, 588 (2000).
7. F. M. Charbonnier, L. A. Southall, and W. A. Mackie, J. Vac. Sci. Technol. B 22, 1643 (2004).
8. F. M. Charbonnier, L. A. Southall, and W. A. Mackie, J. Vac. Sci. Technol. B 23, 723 (2005).
9. M. Watanabe, T. Yagyu, O. Nishikawa, T. Yamaguchi, N. Choi, H. Tokumoto, and S. Nakano, Jpn. J. Appl. Phys., Part 1 41, 7469 (2002).
10. Y. Gotoh, M. Nagao, D. Nozaki, K. Utsumi, K. Inoue, T. Nakatani, T. Sakashita, K. Betsui, H. Tsuji, and J. Ishikawa, J. Appl. Phys. 95, 1537 (2004).
11. Y. Gotoh, K. Mukai, Y. Kawamura, H. Tsuji, and J. Ishikawa, J. Vac. Sci. Technol. B 25, 508 (2007).
12. Y. Saito, K. Hata, and T. Murata, Jpn. J. Appl. Phys., Part 2 39, L271 (2000).
13. R. G. Forbes, C. J. Edgcombe, and U. Valdŕ, Ultramicroscopy 95, 57 (2003).
14. O. Gröning, O. M. Küttel, Ch. Emmenegger, P. Gröning, and L. Schlapbach, J. Vac. Sci. Technol. B 18, 665 (2000).
15. P. Liu, Y. Wei, K. L. Jiang, Q. Sun, X. B. Zhang, S. S. Fan, S. F. Zhang, C. G. Ning, and J. K. Deng, Phys. Rev. B 73, 235412 (2006).
16. C. F. Eyring, S. S. Mackeown, and R. A. Millikan, Phys. Rev. 31, 900 (1928).
17. K. Nishida, F. Iwatsu, and H. Morikawa, J. Vac. Soc. Jpn. 48, 115 (2005) [in Japanese].