Effect of CeO 2 buffer layer thickness on the structures and properties of YBCO coated conductors

Applied Surface Science

Volumn 253, Issue 17, 2007, Pages 7172-7177

  Li, Meiya ^a   Zhao, Xingzhong ^a   Ma, B ^b   Dorris, S E ^b   Balachandran, U ^b   Maroni, V A ^b  

^a WUHAN UNIVERSITY   (China)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Biaxial textures; Cerium oxide; Laser ablation; Thickness effect; YBCO coated conductors

Indexed keywords

BUFFER LAYERS; CERIUM COMPOUNDS; LASER ABLATION; PULSED LASER DEPOSITION; X RAY DIFFRACTION; YTTRIUM BARIUM COPPER OXIDES;

BIAXIAL TEXTURES; CERIUM OXIDE; THICKNESS EFFECT; YBCO COATED CONDUCTORS;

FILM GROWTH;

EID: 34249082207     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.02.186     Document Type: Article

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