Confocal scanning electroluminescence spectro-microscope for multidimensional light-emitting property analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6473, Issue , 2007, Pages

  Hong, S ^a   Onushkin, G ^a   Park, J S ^a   Kim, B K ^a   Lee, D Y ^a   Fomin, A ^a   Ko, K ^a   Kim, J W ^a  

^a Samsung Electro Mechanics   (South Korea)

Author keywords

Confocal; Electroluminescence; LED; Light emitting diode; Micro EL; Microscope; OLED; Scanning

Indexed keywords

CONFOCAL MICROSCOPY; ELECTROLUMINESCENCE; IMAGE RESOLUTION; LIGHT EMITTING DIODES; NONDESTRUCTIVE EXAMINATION; WAVELENGTH;

CONFOCAL SCANNING ELECTROLUMINESCENCE SPECTRO-MICROSCOPE (CSESM); LIGHT-EMITTING PROPERTY ANALYSIS; PHOTOLUMINESCENCE MICSOSCOPES; WAVELENGTH DISTRIBUTION;

LIGHT EMISSION;

EID: 34249054166     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.700079     Document Type: Conference Paper

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