The conduction mechanisms of Cu and Ni nanotubules at their different formation stages

Proceedings - KORUS 2003: 7th Korea-Russia International Symposium on Science and Technology

Volumn 1, Issue , 2003, Pages 129-134

  Petrov, A ^a,b,c   Fink, D ^a   Demyanov, S ^b   Muller M ^a   Sieber, I ^a   Berdinsky, A ^d   Chun, H G ^e   Chadderton, L T ^f  

^a HAHN MEITNER INSTITUT   (Germany)

^b INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

^c UNIVERSITY OF HAGEN   (Germany)

^d NOVOSIBIRSK STATE TECHNICAL UNIVERSITY   (Russian Federation)

^e University of Ulsan   (South Korea)

^f AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Conductivity measurement; Crystallization; Etching; Performance evaluation; Polymers; Probes; Scanning electron microscopy; Spectroscopy; Transmission electron microscopy; Voltage measurement

Indexed keywords

CRYSTALLITES; CRYSTALLIZATION; DEPOSITION; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON MICROSCOPY; ETCHING; GEOMETRY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; METALS; NICKEL; POLYMERS; PRECIPITATION (CHEMICAL); PROBES; SPECTROSCOPY; TEMPERATURE DISTRIBUTION; TRANSMISSION ELECTRON MICROSCOPY; VOLTAGE MEASUREMENT;

CONDUCTION MECHANISM; CONDUCTIVITY MEASUREMENTS; CONDUCTIVITY MECHANISMS; CURRENT/VOLTAGE MEASUREMENTS; DEPOSITION CONDITIONS; ELECTRONIC APPLICATION; PERFORMANCE EVALUATION; TEMPERATURE DEPENDENCE;

SCANNING ELECTRON MICROSCOPY;

EID: 34249035350     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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