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Volumn 40, Issue 3, 2007, Pages 526-531

A mini-goniometer for X-ray diffraction studies down to 4 K on four-circle diffractometers equipped with two-dimensional detectors

Author keywords

Charge density studies; Low temperature; Single crystal; Structure determination; X ray diffraction

Indexed keywords


EID: 34249016932     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807013490     Document Type: Article
Times cited : (5)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.