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Volumn 56, Issue 3, 2007, Pages 913-917

Switched capacitor signal conditioning for differential capacitive sensors

Author keywords

Capacitive sensors; Differential capacitive sensor; Ratio metric measurement principle; Signal conditioning; Switched capacitor circuits

Indexed keywords

CAPACITANCE; CAPACITORS; ELECTRIC POTENTIAL; ELECTRIC VARIABLES MEASUREMENT; SENSORS;

EID: 34249005203     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.894802     Document Type: Article
Times cited : (38)

References (12)
  • 1
    • 4644247939 scopus 로고    scopus 로고
    • A high sensitivity conditioning circuit for capacitive sensors including stray effects compensation and dummy sensors approach
    • Como, Italy, May
    • S. Baglio, S. Catorina, G. Ganci, and N. Savalli, "A high sensitivity conditioning circuit for capacitive sensors including stray effects compensation and dummy sensors approach," in Proc. IEEE IMTC, Como, Italy, May 2004, pp. 1542-1545.
    • (2004) Proc. IEEE IMTC , pp. 1542-1545
    • Baglio, S.1    Catorina, S.2    Ganci, G.3    Savalli, N.4
  • 2
    • 0038757562 scopus 로고    scopus 로고
    • W. L. Lien, B. S. Quek, and R. Walia, A displacement-to-voltage converter circuit using a switched-capacitor technique, in Proc. IEEE ISCAS, Bangkok, Thailand, May 2003, 4, pp. IV-880-IV-883.
    • W. L. Lien, B. S. Quek, and R. Walia, "A displacement-to-voltage converter circuit using a switched-capacitor technique," in Proc. IEEE ISCAS, Bangkok, Thailand, May 2003, vol. 4, pp. IV-880-IV-883.
  • 3
    • 4344638221 scopus 로고    scopus 로고
    • A single-ended to differential capacitive sensor interface circuit designed in CMOS technology
    • Vancouver, BC, Canada, May
    • S. Tajeshwar and Y. Trond, "A single-ended to differential capacitive sensor interface circuit designed in CMOS technology," in Proc. IEEE ISCAS, Vancouver, BC, Canada, May 2004, pp. I-948-I-951.
    • (2004) Proc. IEEE ISCAS
    • Tajeshwar, S.1    Trond, Y.2
  • 4
    • 4644307263 scopus 로고    scopus 로고
    • A low cost microcontroller interface for low-value capacitive sensors
    • Como, Italy, May
    • R. Ferran, G. Manel, and R. Pallas-Areny, "A low cost microcontroller interface for low-value capacitive sensors," in Proc. IEEE IMTC, Como, Italy, May 2004, pp. 1771-1775.
    • (2004) Proc. IEEE IMTC , pp. 1771-1775
    • Ferran, R.1    Manel, G.2    Pallas-Areny, R.3
  • 5
    • 0036826018 scopus 로고    scopus 로고
    • An accurate interface for capacitive sensors
    • Oct
    • X. Li and G. C. M. Meijer, "An accurate interface for capacitive sensors," IEEE Trans. Instrum. Meas., vol. 51, no. 5, pp. 935-939, Oct. 2002.
    • (2002) IEEE Trans. Instrum. Meas , vol.51 , Issue.5 , pp. 935-939
    • Li, X.1    Meijer, G.C.M.2
  • 6
    • 0021445659 scopus 로고
    • A high-resolution capacitance-to-frequency converter
    • Jun
    • F. Krummenacher, "A high-resolution capacitance-to-frequency converter," IEEE J. Solid-State Circuits, vol. SSC-20, no. 3, pp. 666-670, Jun. 1985.
    • (1985) IEEE J. Solid-State Circuits , vol.SSC-20 , Issue.3 , pp. 666-670
    • Krummenacher, F.1
  • 7
    • 0031988291 scopus 로고    scopus 로고
    • High accuracy circuits for on-chip capacitance ratio testing and sensor readout
    • Feb
    • B. Wang, T. Kajita, T. Sun, and G. Temes, "High accuracy circuits for on-chip capacitance ratio testing and sensor readout," IEEE Trans. Instrum. Meas., vol. 47, no. 1, pp. 16-20, Feb. 1998.
    • (1998) IEEE Trans. Instrum. Meas , vol.47 , Issue.1 , pp. 16-20
    • Wang, B.1    Kajita, T.2    Sun, T.3    Temes, G.4
  • 8
    • 0012154706 scopus 로고    scopus 로고
    • A MOSFET-only second order delta-sigma modulator for capacitive sensors interfaces
    • Pafos, Cyprus, Sep
    • J. M. G. Cama, S. A. Bota, E. Montane, and J. Samitier, "A MOSFET-only second order delta-sigma modulator for capacitive sensors interfaces," in Proc. IEEE ICECS, Pafos, Cyprus, Sep. 1999, pp.1689-1692.
    • (1999) Proc. IEEE ICECS , pp. 1689-1692
    • Cama, J.M.G.1    Bota, S.A.2    Montane, E.3    Samitier, J.4
  • 9
    • 0035720935 scopus 로고    scopus 로고
    • A simple interface circuit to measure very small capacitance changes in capacitive sensors
    • Dec
    • D. M. G. Preethichandra and K. Shida, "A simple interface circuit to measure very small capacitance changes in capacitive sensors," IEEE Trans. Instrum. Meas., vol. 50, no. 6, pp. 1583-1586, Dec. 2001.
    • (2001) IEEE Trans. Instrum. Meas , vol.50 , Issue.6 , pp. 1583-1586
    • Preethichandra, D.M.G.1    Shida, K.2
  • 10
    • 0032131297 scopus 로고    scopus 로고
    • An interface circuit for high-accuracy signal processing of differential-capacitance transducers
    • Aug
    • K. Mochizuki, T. Masuda, and K. Watanabe, "An interface circuit for high-accuracy signal processing of differential-capacitance transducers," IEEE Trans. Instrum. Meas., vol. 47, no. 4, pp. 823-827, Aug. 1998.
    • (1998) IEEE Trans. Instrum. Meas , vol.47 , Issue.4 , pp. 823-827
    • Mochizuki, K.1    Masuda, T.2    Watanabe, K.3
  • 11
    • 0031988215 scopus 로고    scopus 로고
    • A relaxation oscillator-based interface for high-accuracy ratiometric signal processing of differential-capacitance transducers
    • Feb
    • K. Mochizuki, K. Watanabe, T. Masuda, and M. Katsura, "A relaxation oscillator-based interface for high-accuracy ratiometric signal processing of differential-capacitance transducers," IEEE Trans.Instrum. Meas., vol. 47, no. 1, pp. 11-15, Feb. 1998.
    • (1998) IEEE Trans.Instrum. Meas , vol.47 , Issue.1 , pp. 11-15
    • Mochizuki, K.1    Watanabe, K.2    Masuda, T.3    Katsura, M.4
  • 12
    • 0035483204 scopus 로고    scopus 로고
    • A switched-capacitor interface for differential capacitance transducers
    • Oct
    • S. Ogawa, Y Oisugi, K. Mochizuki, and K. Watanabe, "A switched-capacitor interface for differential capacitance transducers," IEEE Trans. Instrum. Meas., vol. 50, no. 5, pp. 1296-1301, Oct. 2001.
    • (2001) IEEE Trans. Instrum. Meas , vol.50 , Issue.5 , pp. 1296-1301
    • Ogawa, S.1    Oisugi, Y.2    Mochizuki, K.3    Watanabe, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.