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Volumn 4, Issue , 2003, Pages

A displacement-to-voltage converter circuit using a switched-capacitor technique

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CMOS INTEGRATED CIRCUITS; ELECTRIC CONVERTERS; SILICON SENSORS; VOLTAGE MEASUREMENT;

EID: 0038757562     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (6)
  • 1
    • 0020543754 scopus 로고
    • An MOS switched-capacitor readout amplifier for capacitive pressure sensors
    • Y. E. Park and K. D. Wise. "An MOS Switched-Capacitor Readout Amplifier for Capacitive Pressure Sensors," IEEE Custom IC Conf, pp. 380-384, 1983.
    • (1983) IEEE Custom IC Conf , pp. 380-384
    • Park, Y.E.1    Wise, K.D.2
  • 2
    • 0025698106 scopus 로고
    • An ASIC for high-resolution capacitive microaccelerometers
    • H. Leuthold and F. Rudolf, "An ASIC for High-Resolution Capacitive Microaccelerometers," Sensors and Actuators, A21-A23, pp. 278-281, 1990.
    • (1990) Sensors and Actuators , vol.A21-A23 , pp. 278-281
    • Leuthold, H.1    Rudolf, F.2
  • 3
    • 0027987532 scopus 로고
    • A 15 b electromechanical sigma-delta converter for acceleration measurements
    • San Francisco, USA, February
    • T. Smith e.a. "A 15b Electromechanical Sigma-Delta Converter for Acceleration Measurements," ISSCC'94, San Francisco, USA, February 1994.
    • (1994) ISSCC'94
    • Smith, T.1
  • 5
    • 0019009650 scopus 로고
    • Improved circuits for the realization of switched-capacitor filters
    • April
    • K. Martin. "Improved Circuits for the Realization of Switched-Capacitor Filters," IEEE Trans. Circuits and Systems, Vol. CAS-27, no. 4, pp. 237-244, April 1980.
    • (1980) IEEE Trans. Circuits and Systems , vol.CAS-27 , Issue.4 , pp. 237-244
    • Martin, K.1
  • 6
    • 0030286542 scopus 로고    scopus 로고
    • Circuit techniques for reducing the effects of op-amp imperfections: Autozeroing, correlated double sampling, and chopper stabilization
    • November
    • C. Enz and G. C. Temes, "Circuit Techniques for Reducing the Effects of Op-Amp Imperfections: Autozeroing, Correlated Double Sampling, and Chopper Stabilization," IEEE Proceedings, Vol 84, no. 11, November 1996.
    • (1996) IEEE Proceedings , vol.84 , Issue.11
    • Enz, C.1    Temes, G.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.