Optical properties of GeSeTl thin films

Journal of Physics Condensed Matter

Volumn 19, Issue 21, 2007, Pages

  Abd El Raheem, M M ^a,b  

^a TAIF UNIVERSITY   (Saudi Arabia)

^b Sohag University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; FILM THICKNESS; PHASE COMPOSITION; REFRACTIVE INDEX; SEMICONDUCTING GERMANIUM COMPOUNDS;

ELECTRON-BEAM EVAPORATION; OPTICAL GAPS; THALLIUM CONTENT;

THIN FILMS;

EID: 34249004623     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/21/216209     Document Type: Article

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