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M. J. Burbidge, F. Poullet, J. Tijou, and A. Richardson, "Investigations for minimum invasion digital only built-in 'ramp' based test techniques for charge pump PLL's," J. Electron. Testing: Theory Applicat., vol. 19, pp. 481-490, Aug. 2003.
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(2003)
J. Electron. Testing: Theory Applicat
, vol.19
, pp. 481-490
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Burbidge, M.J.1
Poullet, F.2
Tijou, J.3
Richardson, A.4
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