Ni-Fe thin film coated Cu wires for field sensing applications

Sensor Letters

Volumn 5, Issue 1, 2007, Pages 93-97

  Petridis, C ^a   Ktena, A ^b   Laskaris, E ^a   Dimitropoulos, P ^c   Hristoforou, E ^a  

^a NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

^b Chalkis Institute of Technology   (Greece)

^c UNIVERSITY OF THESSALY   (Greece)

Author keywords

Fluxgates; Inverse Wiedermann effect; Pulsed current electrodeposition; Thin film coasted wires

Indexed keywords

ELECTRODEPOSITION; MAGNETIC HYSTERESIS; MAGNETIC PROPERTIES; MAGNETOSTRICTION; NICKEL ALLOYS; THIN FILMS;

FLUXGATES; INVERSE WIEDEMANN EFFECT; PULSED CURRENT ELECTRODEPOSITION; THIN FILM COASTED WIRES;

NANOWIRES;

EID: 34248592849     PISSN: 1546198X     EISSN: None     Source Type: Journal    
DOI: 10.1166/sl.2007.071     Document Type: Conference Paper

References (4)

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2. A. Tipek, T. O'Donnell, P. Ripka, and J. Kubik, IEEE Sensors 5, 1264 (2005).
3. I. Sasada and T. Usui, Orthogonal fluxgate magnetometer utilizing bias switching for stable operation, Proceedings of IEEE Sensors 2, 468 (2003).
4. I. Giouroudi, A. Ktena, and E. Hristoforou, J. Optoelectronics and Adv. Mater. 6, 661 (2004).