Microstructural characterization of cylindrical Fe1-xNi x thin films

Journal of Optoelectronics and Advanced Materials

Volumn 6, Issue 2, 2004, Pages 661-666

  Giouroudi, I ^a   Ktena, A ^a   Hristoforou, E ^a  

^a NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

Author keywords

Electrodeposition; Microstructural characterization; Thin films

Indexed keywords

COPPER; ELECTRODEPOSITION; HEAT TREATMENT; IRON COMPOUNDS; MICROSTRUCTURE; SENSORS; STAINLESS STEEL; X RAY DIFFRACTION;

DEPOSITION TEMPERATURE; MAGNETIC STEERING; MICROSTRUCTURAL CHARACTERIZATION;

THIN FILMS;

EID: 3142693618     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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