Direct Determination of Trace Elements in High Purity Gallium by High Resolution Inductively Coupled Plasma Mass Spectrometry

Chinese Journal of Analytical Chemistry

Volumn 34, Issue 11, 2006, Pages 1570-1574

  Xie, Hualin ^a   Nie, Xidu ^a   Tang, Yougen ^b  

^a HUNAN INSTITUTE OF TECHNOLOGY   (China)

^b CENTRAL SOUTH UNIVERSITY   (China)

Author keywords

High purity gallium; High resolution inductively coupled plasma mass spectrometry (HR ICP MS); Internal standard; Matrix effect; Spectral interferences; Trace elements

Indexed keywords

EID: 34248573034     PISSN: 2533820     EISSN: 18722040     Source Type: Journal    
DOI: 10.1016/S1872-2040(07)60016-4     Document Type: Article

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